L. Bellon, S. Ciliberto, H. Boubaker and L. Guyon, Optics Communications 207 49-56 (2002)
doi: 10.1016/S0030-4018(02)01475-X
We present a new design of the Nomarski interferometer, which can measure displacements of several microns, with a resolution better than 1E-13 m/root(Hz). In the standard design this sensitivity can be achieved only within a 100 nm displacement range. One main advantage of this new set-up of the interferometer is the total independence of the measure sensitivity on the interferometer thermal drifts.