Samuel Albert, Aubin Archambault, Artyom Petrosyan, Caroline Crauste-Thibierge, Ludovic Bellon, Sergio Ciliberto, EPL 131, 10008 (2020)
doi: 10.1209/0295-5075/131/10008
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a colloïdal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.