Roberto Pérez-Aparicio, Caroline Crauste-Thibierge, Marius Tanase, Pascal Metz, Ludovic Bellon, Antoine Naert, and Sergio Ciliberto, Rev. Sci. Instrum. 86, 044702 (2015)
doi: 10.1063/1.4916260
We present an innovative technique which allows the simultaneous measurement of the dielectric constant of a material at many frequencies, spanning a four orders of magnitude range chosen between 10-2 Hz and 104 Hz. The sensitivity and accuracy are comparable to those obtained using standard single frequency techniques. The technique is based on three new and simple features: a) the precise real time correction of the amplification of a current amplifier; b) the specific shape of the excitation signal and its frequency spectrum; and c) the precise synchronization between the generation of the excitation signal and the acquisition of the dielectric response signal. This technique is useful in the case of relatively fast dynamical measurements when the knowledge of the time evolution of the dielectric constant is needed.